Products and Services
Services
Waferdata offers a wide range of custom application and consultancy services related to yield management and manufacturing efficiency throughout fab and test based on over 25 years of experience in this field.
Although we sell our own products we can still offer an independent source of expertise in the collection, integration and use of semiconductor, MEMS and photovoltaic data. Our application and consultancy services provide outsourcing options for fabless startups, mature fabless companies, integrated device manufacturers (IDM) and other data analysis tool providers.

Over the years we have been involved in many diverse projects related to data and it's use in managing yield or improving manufacturing efficiency.

The duration of previous engagements has varied from a few days to many months.

Areas of expertise include:
dot Testers (ATE) dot Test cell controllers
dot Prober operation dot Data formats including STDF¹ and KLARF²
dot Wafer mapping dot Tester to prober/handler interfacing
dot PAT (Part Average Testing) dot GDBN (Good Die in a Bad Neighbourhood)
dot Defectivity and associated data formats dot Spatial Signature Analysis (SSA)
dot Fab/Test data integration dot Data analysis techniques
dot Databases and SQL programming dot Web servers and web programming
dot User interfaces dot Programming
dot Scripting dot Tcl/Tk
If you need help collecting, integrating or using semiconductor, MEMS or photovoltaic data to manage yield or improve manufacturing efficiency please Contact Us directly or complete the Enquiry form.
(1) STDF (Standard Test Data Format) is owned by Teradyne.
(2) KLARF (KLA Results Format) is owned by KLA-Tencor.
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