
Iain GardnerIain has been Managing Director of Waferdata Limited since he founded the company in 2003 to provide an independent source of semiconductor data analysis expertise. He draws on 25+ years of experience in the semiconductor industry.
Prior to Waferdata, Iain held engineering and management positions at National Semiconductor, LTX, KLA-Tencor and Defect and Yield Management (DYM).
Iain has a B.Sc. in Mathematics and Natural Philosophy from Glasgow University.