Products and Services
ASSA
ASSA (Advanced Spatial Signature Analysis) from AOVtech detects and identifies spatial patterns in defect files, bin map files and failed bit files.
Identifying spatial patterns allows fast diagnosis and elimination of manufacturing problems.
dot Proactive inline production monitoring tool used by major semiconductor fabs and foundries.
dot Detects defect spatial signatures on patterned and un-patterned wafers.
dot Comprehensive built-in library requires no training or configuration - results are consistent.
dot Multiple algorithms allow detection of the widest range of pattern types.
dot Automatically detects new and unknown patterns.
dot Monitors adder defects by count and by spatial pattern.
dot Allows historical investigation of specific patterns in multiple wafers and lots.
dot Supports defocus and reticle contamination.
dot Predicts the probable source of defects by tool type.
dot Distributed and supported in Europe by Waferdata.
Please Contact Us or visit the AOVtech web site for further information.
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